Development and prototyping of impedance CT scan for measurement of complex resistance distribution
Journal Title: Вісник НТУУ КПІ. Серія Радіотехніка, Радіоапаратобудування - Year 2011, Vol 0, Issue 44
Abstract
Structure and concepts of impedance CT scan for complex resistance distribution measurements of EIT section are proposed. The prototype of the CT scanner and the results of modeling are represented. Tomograph allows the impedance measurements inclusive transfer resistance for building a phantom (output voltage module and phase shift between output voltage and sours current). This allows you to extend the capabilities of diagnostic imaging in biology, medicine and technology. A prototyping tool showed both the opportunity and the relative ease of creating hardware tomograph. Experience has shown the need to reduce layout instrumental amplifier noise using narrowband filters.
Authors and Affiliations
E. Gaydayenko, A. Movchanyuk
Keywords
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- EP ID EP309455
- DOI 10.20535/RADAP.2011.44.148-156
- Views 72
- Downloads 0
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