Effect of Annealing Temperature on The Refrective Index and Dielectric Properties of TiO2/MnO2 CORE/SHELL Thin Films

Journal Title: JOURNAL OF ADVANCES IN PHYSICS - Year 0, Vol 6, Issue 3

Abstract

Thin film of the form TiO2/MnO2 was deposited using the chemical bath method. The deposited thin films were annealed at temperatures of in order to investigate the effect of annealing temperature on the refractive index and dielectric property. To do this the films were characterized using UV-Spectrophotometer and XRD analysis was also carriedout to study the structural nature of the deposited film. Our results reaveled that annealing has profound effect on theindex of refraction and the dielectric properties. 

Authors and Affiliations

Peter Ekuma Agbo

Keywords

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  • EP ID EP653573
  • DOI 10.24297/jap.v6i3.1756
  • Views 159
  • Downloads 0

How To Cite

Peter Ekuma Agbo (0). Effect of Annealing Temperature on The Refrective Index and Dielectric Properties of TiO2/MnO2 CORE/SHELL Thin Films. JOURNAL OF ADVANCES IN PHYSICS, 6(3), 1227-1232. https://europub.co.uk/articles/-A-653573