Electrical Conductivity and Magnetoresistance of Silicon Microstructures in The Vicinity to Metal-Insulator Transition

Journal Title: Фізика і хімія твердого тіла - Year 2018, Vol 19, Issue 3

Abstract

Complex research of silicon microcrystals with specific resistance from ρ<sub>300K</sub> = 0.025 Ohm × cm to ρ<sub>300K</sub> =0.007 Ohm × cm doped with boron transport impurity to concentrations corresponding to the transition of metaldielectricand modified transition metal nickel nickel at low temperatures to the temperature of liquefied helium T= 4.2 K in magnetic fields up to 14 Tl. The features of electrophysical characteristics of samples at lowtemperatures in strong magnetic fields up to 14 Tl are determined due to the influence of a magnetic impurity insemiconductor-diluted magnetism and the use of such crystals in sensors of physical quantities (temperature,magnetic field, deformation) is proposed.

Authors and Affiliations

Yu. М. Khoverko, N. О. Shcherban

Keywords

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  • EP ID EP498889
  • DOI 10.15330/pcss.19.3.246-253
  • Views 32
  • Downloads 0

How To Cite

Yu. М. Khoverko, N. О. Shcherban (2018). Electrical Conductivity and Magnetoresistance of Silicon Microstructures in The Vicinity to Metal-Insulator Transition. Фізика і хімія твердого тіла, 19(3), 246-253. https://europub.co.uk/articles/-A-498889