Enhancing sensitivity of SPR sensors by using nanostructured Au chips coated with functional plasma polymer nanofilms
Journal Title: Semiconductor Physics, Quantum Electronics and Optoelectronics - Year 2017, Vol 20, Issue 3
Abstract
The sensitivity of surface plasmon resonance (SPR) sensors operating in the Kretschmann configuration was investigated using Au SPR chips with a nano-grating surface functionalized via deposition of a-C:H:O plasma polymer films. The surface of the chips was nanopatterned in order to improve the sensitivity of the sensor, as compared with the sensitivity of standard Au chips with a flat (unstructured) surface. It was found that deposition of the plasma polymer nanofilms neither affected the degree of refractometer sensitivity enhancement, nor the width of the operation range of the environment refractive index (n), in which the enhancement was observed. Such functionalization of the chip surface merely resulted in the shift of the operation range position to smaller values of n in comparison to non-coated chips requiring deposition of stable functional films.
Authors and Affiliations
I. Z. Indutnyi, Yu. V. Ushenin, D. Hegemann, M. Vandenbossche, V. I. Myn’ko, P. E. Shepeliavyi, M. V. Lukaniuk, P. M. Lytvyn, R. V. Khrystosenko
Long-term radiation-induced optical darkening effects in chalcogenide glasses
In this work, it is reported that the -irradiated (2.41 MGy accumulated dose) glasses As2S3 (2 mm thick) and Ge15.8As21S63.2 (1 mm thick), both measured 10 years after -irradiation, exhibit radiation-induced optical...
Structural and optical studies of Cu6PSe5I-based thin film deposited by magnetron sputtering
Cu5.5P1.2Se5.0I1.3 thin film was deposited onto silicate glass substrate by non-reactive radio frequency magnetron sputtering. Structural studies were carried out using X-ray diffraction and SEM techniques. Spectrometric...
Impact of traps on current-voltage characteristic of n+-n-n+ diode
A model of n+-n-n+ diode is analyzed using analytical and numerical methods. First, it was conducted a phase-plane analysis, which was aimed at further calculations for low and high injection approximations. A numerical...
Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu6PS5I-based thin films deposited using magnetron sputtering
Cu6PS5I-based thin films were deposited using non-reactive radio-frequency magnetron sputtering. Structural studies of thin films were performed by scanning electron microscopy, their chemical composition were determined...
I127 NQR spectra of Pb1–xCdxI2 and (BiI3)(1–x)(PbI2)x of mixed layered semiconductors
The results of studying the concentration and temperature dependences of NQR spectrum parameters inherent to I127 in mixed layered semiconductors Pbx–1CdxI2 and (BiI3)(1–x)(PbI2)x are presented for x ≤ 0.30 and T = 77…15...