Investigation of V1-xTixFeSb Semiconductor Solid Solution. II. Peculiarities of Crystal and Electronic Structure

Journal Title: Фізика і хімія твердого тіла - Year 2015, Vol 16, Issue 2

Abstract

The peculiarities of the crystalandelectronicstructureof V1-xTixFeSb, х = 0 – 0,20, semiconductor solid solution wereinvestigated. Themechanismofgenerationofstructuraldefectsofacceptoranddonornatureisdescribed. In particular the nature of donors in n-VFeSb was established (“a priori doping”) as a result of presence of vacancies in Sb atomic site (4b). The obtained result lays in the basis of the technology for obtaining thermoelectric materials based on n-VFeSb with maximal efficiency of thermal to electrical energy conversion.

Authors and Affiliations

V. V. Romaka, P. -F. Rogl, L. P. Romaka, Yu. V. Stadnyk, R. O. Korzh, V. Ya. Krayovskyy, T. M. Kovbasuk, H. V. Tsygylyk

Keywords

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  • EP ID EP306615
  • DOI 10.15330/pcss.16.2.335-340
  • Views 50
  • Downloads 0

How To Cite

V. V. Romaka, P. -F. Rogl, L. P. Romaka, Yu. V. Stadnyk, R. O. Korzh, V. Ya. Krayovskyy, T. M. Kovbasuk, H. V. Tsygylyk (2015). Investigation of V1-xTixFeSb Semiconductor Solid Solution. II. Peculiarities of Crystal and Electronic Structure. Фізика і хімія твердого тіла, 16(2), 335-340. https://europub.co.uk/articles/-A-306615