Low Cost Computerized Digital IC Tester
Journal Title: The International Journal of Technological Exploration and Learning - Year 2014, Vol 3, Issue 2
Abstract
This paper focuses on testing of any available digital IC of the TTL or CMOS family of 24 pins. Since the IC tester is programmable, any number of ICs can be tested within the constraint of the memory available. This model applies the necessary signals to the inputs of the IC, monitoring the outputs at each stage and comparing them with the outputs of the predefined truth table. Any discrepancy in the functioning of the IC results in a fault indication. Otherwise displays the acceptable gates on the LCD as well as the PC screen. In which pin the fault is detected that also is displayed on the LCD as well as PC screen. In this paper ,the device which is been described , basically performs checking work of digital ICs. The working method is very much correct & it performs faster than any other device. Several gates are available in a basic digital IC, whether those gates are correct or not ,that is also been displayed here. The regular digital IC tester available in market costs somewhere round Rs15000/-,but those ones are not computerized as well as very much slow in process. Moreover, it can’t store the testing result in the database & these devices can be checked in the filed only, checking via control room isn’t possible in this case. In our research work we have designed such a digital IC tester which is removing all the above mentioned drawbacks. The main important fact is the manufacturing cost of the device is not more than Rs600/-
Authors and Affiliations
Sudipta Chakraborty| Department of Electronics Engineering Indian School Mines Dhanband, Saunak Bhattacharya, Debabrata Raha| Department of Electronics Engineering Techno India Group
Keywords
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