On determination of Cd1–xZnxTe composition from an analysis of the 4.2, 77 and 295 K edge photoluminescence spectra

Abstract

The known and obtained in this work dependences of the 4.2, 77 and 295 K peak positions hm of the Cd1–xZnxTe edge emission bands induced by: (a) annihilation of free X and bound on shallow neutral acceptors A0 or shallow neutral donors D0 excitons A0X and D0X and (b) recombination of free and shallow donor bound electrons with free holes on Cd1–xZnxTe composition x (x  0.28) are analyzed in detail. It is shown that the 4.2 K peak position of the A0X induced emission band used for the exact x determination could be related with some problems arising from variety of the 4.2 K hm(A0X) vs. x dependences. As a result of the pointed problem, analysis of the 4.2 K hm(A0X) vs. x dependences permits to find the x value with some inaccuracy (some unknown factors shift the energy position of the A0X bound exciton are responsible for this fact). The noticeable (differing from the expected theoretical ones) differences of the peak positions of emission bands hm induced by radiative annihilation of D0X bound excitons at 295 K, radiative recombination of donor bound electrons D0 with free holes h at 300 K and radiative annihilation of free electrons e and holes at 300 K, i.e. of 295 K hm(D0X), 300 K hm (D0h) and 300 K hm (eh) values, accordingly, vs. x dependences are observed and briefly analyzed.

Authors and Affiliations

K. D. Glinchuk, V. P. Maslov, O. M. Strilchuk, A. B. Lyapina

Keywords

Related Articles

Nanoferroics: State-of-art, gradient-driven couplings and advanced applications (Author’s review)

Ferroics and multiferroics are unique objects for fundamental physical research of complex nonlinear processes and phenomena that occur in them within micro- or nanoscale. Due to the possibility of their physical propert...

Effective polycrystalline sensor of ultraviolet radiation

Deposition of special thin layers with high and low resistance in space charge region of surface barrier photoconverters based on the p-Cu1.8S/n-CdS structure leads to a sufficient increase in photosensitivity and decrea...

Deposition and optical absorption studies of Cu–As–S thin films

Cu–As–S thin films were deposited using the thermal evaporation technique. Optical transmission spectra of Cu 0.1 As 2.1 S 3.1 thin films were measured within the temperature range 77...300 K. Temperature behaviour of ab...

Ellipsometry of hybrid noble metal-dielectric nanostructures

Angular ellipsometric measurements of thin Ag, Cu films covered by HfO 2 protective layer were performed. The ellipsometric parameters ψ and ∆ were measured in θ = 43°...85° light incidence angle range, where ψ is the az...

Protective applications of vacuum-deposited perfluoropolymer films

The paper summarizes in brief applications of perfluoropolymer thin films deposited from the gas phase by several different methods, for protection of various materials and devices both at the research stage and already...

Download PDF file
  • EP ID EP232784
  • DOI 10.15407/spqeo20.03.305
  • Views 79
  • Downloads 0

How To Cite

K. D. Glinchuk, V. P. Maslov, O. M. Strilchuk, A. B. Lyapina (2017). On determination of Cd1–xZnxTe composition from an analysis of the 4.2, 77 and 295 K edge photoluminescence spectra. Semiconductor Physics, Quantum Electronics and Optoelectronics, 20(3), 305-313. https://europub.co.uk/articles/-A-232784