Reliability of а radioelectronic equipment cells design at external mechanical influences
Journal Title: Вісник НТУУ КПІ. Серія Радіотехніка, Радіоапаратобудування - Year 2009, Vol 0, Issue 39
Abstract
The influence of pressure in conclusions of microcircuits, microassembly, and in them solder connections, as result of action of external mechanical loadings – vibrations and impacts – on parameters of reliability of a cell of the radioelectronic device is considered.
Authors and Affiliations
B. Uvarov
Keywords
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- EP ID EP309608
- DOI 10.20535/RADAP.2009.39.91-98
- Views 66
- Downloads 0
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