Reliability of а radioelectronic equipment cells design at external mechanical influences

Abstract

The influence of pressure in conclusions of microcircuits, microassembly, and in them solder connections, as result of action of external mechanical loadings – vibrations and impacts – on parameters of reliability of a cell of the radioelectronic device is considered.

Authors and Affiliations

B. Uvarov

Keywords

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  • EP ID EP309608
  • DOI 10.20535/RADAP.2009.39.91-98
  • Views 68
  • Downloads 0

How To Cite

B. Uvarov (2009). Reliability of а radioelectronic equipment cells design at external mechanical influences. Вісник НТУУ КПІ. Серія Радіотехніка, Радіоапаратобудування, 0(39), 91-98. https://europub.co.uk/articles/-A-309608