SPECTROSCOPY OF ATOMS IN A STRONG LASER FIELD: NEW METHOD TO SENSING AC STARK EFFECT, MULTIPHOTON RESONANCES PARAMETERS AND IONIZATION CROSS-SECTIONS

Abstract

The resonant multiphoton resonances shifts and widths and ionization cross-sections for multielectron atoms in a intense laser radiation field are studied. It is carried out a new consistent approach to atom in a strong realistic laser field, based on the relativistic energy formalism (S-matrix adiabatic formalism), relativistic Dirac equation Green function method and relativistic many-body perturbation theory with the Dirac-Kohn-Sham zeroth approximation. In relativistic theory, the Gell-Mann and Low adiabatic formula for energy shift is connected with electrodynamical scattering matrice, which includes interaction with as a laser field as a photon vacuum field (radiative decay). The optimized basis of the relativistic orbitals is generated with using a minimization procedure for the gauge-non-invariant contribution (the fourth-order of the QED perturbation theory) to the radiation width of atomic state. An approach to treating the multiphoton atomic processes is outlined on example of H, Cs, Kr,Mg etc. Analysis shows that the shift and width of the multi-photon resonance line for the interaction “atom- multimode laser pulse” is greater than the corresponding shift and width for a case of the “atom- single-mode pulse” (the Lorenz pulse model) interaction. From the physical point of view it is naturally provided by action of the photon-correlation effects and influence of the laser pulse multi-modity.

Authors and Affiliations

V. V. Buyadzhi, A. V. Glushkov, V. F. Mansarliysky, A. A. Svinarenko

Keywords

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  • EP ID EP399294
  • DOI 10.18524/1815-7459.2015.4.107787
  • Views 47
  • Downloads 0

How To Cite

V. V. Buyadzhi, A. V. Glushkov, V. F. Mansarliysky, A. A. Svinarenko (2015). SPECTROSCOPY OF ATOMS IN A STRONG LASER FIELD: NEW METHOD TO SENSING AC STARK EFFECT, MULTIPHOTON RESONANCES PARAMETERS AND IONIZATION CROSS-SECTIONS. Сенсорна електроніка і мікросистемні технології, 12(4), 27-36. https://europub.co.uk/articles/-A-399294