Structure and temperature profile limits of optic fiber material based tellurium
Journal Title: IOSR Journal of Electronics and Communication Engineering(IOSR-JECE) - Year 2018, Vol 13, Issue 5
Abstract
The X-ray diffraction pattern of the system Te80S20-xBx where (x=0,2.5,5 and B=In or As) confirm the amorphous nature of the thin film samples. The addition of In or As to Te80S20 on the expense of S confirms this result. Also, the non-uniformity of SEM micrographs assures the amorphous nature of these samples. The SEM micrographs of all samples after addition of In or As on the expense of S and even the Er cover layer reveals no change in the amorphous state. The thermal differential analysis (DTA) proves that the glass transition range for Te80S20was 150C(119-1340C). This range reduced to be 80C as 2.5 at % In added on the expense of S. The replacement of In by As reduced this range to be 2-3 0C depending on the As ratio. The crystallization temperature TC of Te80S20 was 1650C. This temperature increased to be 2770C as 2.5 at % In added on the expense of S. The replacement of In by As leads to increase Tc to be in the range 233-2500C depending on the As content. Generally, the observed shrink of the glass transition range give chance to produce optic fiber cables in the amorphous state, saving costs. The high melting temperature Tm keep the optic fiber cable from distortion under the environmental factors and earth movers. Accordingly, these cables can serve the international net communication well.
Authors and Affiliations
M. M. El-zaidia, Z. H. El-Gohary, M. S. Abo Ghazala, G. M. Turky, E. A. Rabea
Keywords
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- EP ID EP439301
- DOI 10.9790/2834-1305014953.
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