Test, Testability and Reliability Aspects of Integrated Circuits
Journal Title: Asigurarea Calităţii – Quality Assurance - Year 2018, Vol 0, Issue 96
Abstract
The role of testing is to detect whether something went wrong and the role of diagnosis is to determine exactly what went wrong. Testability is a design criterion and should be included in design reviews. Quiescent power supply current (IDDQ) testing of a CMOS integrated circuit is a technique for production quality and reliability improvement, design validation, and failure analysis. It has been used for many years by a few companies and has now receiving wider acceptance as an industry tool.
Authors and Affiliations
Titu-Marius BAJENESCU
Keywords
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Test, Testability and Reliability Aspects of Integrated Circuits
The role of testing is to detect whether something went wrong and the role of diagnosis is to determine exactly what went wrong. Testability is a design criterion and should be included in design reviews. Quiescent power...