THE EVOLVING SCIENCE OF MEASUREMENT
Journal Title: Metrology and Measurement Systems - Year 2007, Vol 14, Issue 1
Abstract
This special issue of Metrology and Measurement Systems contains an updated and extended version of selected papers published in the proceedings of the XVIII IMEKO World Congress, held in September 2006 in Rio de Janeiro, Brazil. All those papers were presented and discussed during the sessions organized under the auspices of the IMEKO Technical Committee on Measurement Science (TC7). After the Congress, the presenters were invited to submit a new version of their papers, taking into account not only the progress in their research but also the outcomes of the Congress discussions. The final selection of papers was based on the results of a regular peer review process they were subject to.
Authors and Affiliations
Luca Mari, Roman Morawski
Keywords
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