Ways of Working the Data Obtained Through Atomic Force Microscopy Technology
Journal Title: RECENT - Year 2011, Vol 12, Issue 31
Abstract
The article presents a series of methods of working the data obtained through Atomic Force Microscopy technology. It shows the way in which the obtained data can be used and read through the Labview programming language. Emphasis is also laid on a series of advantages resulting from scanning by the direct contact or the non-contact method. AFM consists of a sharp microfabricated tip attached to a cantilever, which is scanned across a sample. The deflection of this cantilever is monitored using a laser and photodiode and is used to generate imaging or spectra of the surface. The AFM works in a number of different modes.
Authors and Affiliations
Marius BENŢA, Cosmin AFRENŢOAEI, Eusebiu PAIU, Laurenţiu TODORAN, Octavian DADU
Keywords
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