When is an asymmetric truncated Hankel opertor equal to the zero operator? / Kiedy asymetryczny obcięty operator Hankela równy jest operatorowi zerowemu?
Journal Title: Bulletin de la Société des sciences et des lettres de Łódź, Série: Recherches sur les déformations - Year 2017, Vol 0, Issue 3
Abstract
-
Authors and Affiliations
Bartosz Łanucha, Małgorzata Michalska
Keywords
Related Articles
- EP ID EP332049
- DOI -
- Views 40
- Downloads 0
Molecular organization in pentacene thin film on SiO2 surface using spec-troscopic ellipsometry, infrared spectroscopy, and atomic force microscopy / Organizacja molekularna w warstwie pentacenu osadzonej na powierzchni SiO2 przebadana elipsometrią , spektroskopią podczerwieni i mikroskopią sił atomowych
Thin films of pentacene of 32-nm thickness obtained by organic molecular beam depo- sition (OMBD) in high vacuum conditions onto silicon/native silica (Si/SiO2) and fused silica substrates were examined. Anisotropic opti...
Invariants under conformal rescaling of the space-time - A study including consequences for the metric
The conformal transformations play crucial role in the analysis of global structure of the physical space-time. This paper shows some geometrical and physical objects which describe the space-time. There are also given t...
Application of the surface pinning diagram to the study of existence conditions of surface spinwave modes in (Ga, Mn) As thin films
Spin-wave resonance (SWR) is a newly emerged method for studying surface magnetic anisotropy and surface spin-wave modes in (Ga,Mn)As thin films. On the basis of recent SWR studies of (Ga,Mn)As thin films we show that th...
On optimal subspaces for Kolmogorov widths of classes of 2π-periodic analytic functions
The following problem arises: to nd optimal subspaces for Kolmogorov widths of classes of convolutions with generated kernels, which may increase the oscillations.
Heavy ions sputtering and implantation of surface monitored with PIXE / Rozpylanie ciężkimi jonami i implantacja powierzchni monitorowana przy pomocy PIXE
Characteristic X-rays emitted from surfaces and specially prepared thin films as a result of impact of slow heavy ions were measured and analysed. Kinematics of the interaction was simulated numerically with stopping and...