X-RAY AND SEM ANALYSIS OF SILICON DIFFUSED WITH ZINC AND SULFUR IMPURITY ATOMS

Journal Title: International scientific journal Science and Innovation - Year 2023, Vol 2, Issue 11

Abstract

In this work, Zn and S atoms were dopped into silicon by diffusion method, and the effect of Zn and S atoms on the crystal lattice of silicon was studied. Researches and measurements (XRD-6100 Shimadzu X-ray diffractometer, SEM-EVO MA 10 scanning electron microscope) were carried out on modern devices. Measurements were carried out at room temperature (T=300 °K). The results are the basis for our conclusion that ZnS binary compounds are formed on the surface of the Si sample.

Authors and Affiliations

Khaqqulov Maruf Keldiyorovich

Keywords

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  • EP ID EP725050
  • DOI 10.5281/zenodo.10125406
  • Views 58
  • Downloads 0

How To Cite

Khaqqulov Maruf Keldiyorovich (2023). X-RAY AND SEM ANALYSIS OF SILICON DIFFUSED WITH ZINC AND SULFUR IMPURITY ATOMS. International scientific journal Science and Innovation, 2(11), -. https://europub.co.uk/articles/-A-725050