Process Variation Induced Mismatch Analysis In Sense Amplifiers Journal title: International Journal of Research in Computer and Communication Technology Authors: Parita Patel, Sameena Zafar,and Hemant soni Subject(s): Computer and Information Science, Telecommunications
Comparative Analysis of Different Types of Full Adder Circuits Journal title: IOSR Journals (IOSR Journal of Computer Engineering) Authors: M.B Damle Subject(s):
Performance Comparison of Electrical Parameter between GaNFinFET and Si-FinFET Nano Devices Journal title: International Journal of Semiconductor Science & Technology (IJSST) Authors: Anindya Shubro Chakroborty, Javed Hossain, S. M. Mostafa Al Mamun, Zahid Hasan Mahmood Subject(s):
A REVIEW OF DUAL MATERIAL GATE SOI MOSFET Journal title: World Journal of Engineering Research and Technology Authors: Monika Joshi Subject(s):