Heavy ions sputtering and implantation of surface monitored with PIXE / Rozpylanie ciężkimi jonami i implantacja powierzchni monitorowana przy pomocy PIXE Journal title: Bulletin de la Société des sciences et des lettres de Łódź, Série: Recherches sur les déformations Authors: Marek Moneta, Małgorzata Antoszewska-Moneta, Romuald Brzozowski Subject(s):
Magnetoresistance in thin films uncluding thedomain / Magnetoopór w cienkich warstwach zawierających strukturę domenową Journal title: Bulletin de la Société des sciences et des lettres de Łódź, Série: Recherches sur les déformations Authors: Krzysztof Warda, Daniel Baldomir, Manuel Pereiro, Juan Arias, Victor Pardo Subject(s):
Optical properties of PVP/ZnO composite thin films Journal title: Journal of Achievements in Materials and Manufacturing Engineering Authors: T. Tański, W. Matysiak Subject(s): Engineering
Comparison of surface morphology and structure of Al2O3 thin films deposited by sol-gel and ALD methods Journal title: Journal of Achievements in Materials and Manufacturing Engineering Authors: M. Szindler, L.A. Dobrzański, M.M. Szindler, T. Jung Subject(s): Engineering
KAJIAN SIFAT OPTIK FILM TIPIS BST DIDADAH NIOBIUM DAN TANTALUM Journal title: Jurnal Pendidikan Fisika dan Keilmuan (JPFK) Authors: Farida Huriawati, I Irzaman Subject(s):
THIN FILM TECHNOLOGY IN THE FIELD OF ENVIRONMENT Journal title: International journal of research -GRANTHAALAYAH Authors: Subject(s):
Nanostructure of amorphous films Journal title: Semiconductor Physics, Quantum Electronics and Optoelectronics Authors: N. L. Dyakonenko, V.A. Lykah, A. V. Sinelnik, I. A. Korzh, V. I. Bilozertseva Subject(s):
Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu6PS5I-based thin films deposited using magnetron sputtering Journal title: Semiconductor Physics, Quantum Electronics and Optoelectronics Authors: I. P. Studenyak, M. M. Kutsyk, A. V. Bendak, V. Yu. Izai, P. Kúš, M. Mikula Subject(s):
Relaxation of photovoltage in ITO-Ge-Si heterojunction with Ge nanostructured thin film Journal title: Semiconductor Physics, Quantum Electronics and Optoelectronics Authors: S. A. Iliash, Yu. V. Hyrka, S. V. Kondratenko, V. S. Lysenko, Yu. M. Kozyrev, V. V. Lendel Subject(s):
The influence of physical and technological magnetron sputtering modes on the structure and optical properties of CdS and CdTe films Journal title: Semiconductor Physics, Quantum Electronics and Optoelectronics Authors: G. S. Khrypunov, G. I. Kopach, M. M. Harchenko, A. I. Dobrozhan Subject(s):
Comparison of the structure and topography of selected low friction thin films Journal title: Journal of Achievements in Materials and Manufacturing Engineering Authors: A. Paradecka, K. Lukaszkowicz, R. Potempa Subject(s): Engineering
Studies on Cd1Se0.6Te0.4 Thin Films by Spectroscopic and Diffractometer Characterization Journal title: Traektoriâ Nauki Authors: Cliff Orori Mosiori, Duke Ateyh Oeba Subject(s):
Film Thickness Formation in Nanoscale due to Effects of Elastohydrodynamic, Electrostatic and Surface force of Solvation and Van der Waals Journal title: Tribology in Industry Authors: M. F. Abd Al-Samieh Subject(s):
Comparative Study of Performance of Three Different Photovoltaic Technologies Journal title: Mathematical and Software Engineering Authors: Constance Kalu, Ezenugu Isaac, Anthony Umoren Subject(s):
The Thickness Dependence of Thermoelectric Parameters of thin Films Based on Compounds LAST Journal title: Фізика і хімія твердого тіла Authors: B.S. Dzundza, O.B. Kostyuk, V.I. Makovyshyn Subject(s):