Calculation of parameters of image receivers on CCD structures while aircraft survey of the earth surface
Journal Title: Вісник Житомирського державного технологічного університету. Серія: Технічні науки - Year 2019, Vol 83, Issue 1
Abstract
The article provides an analysis of the noise characteristics of optoelectronic image receivers on matrix photosensitive CCD structures with tape addressing and their influence on the resolution of optical-electronic image sensors under low light conditions. The distinctive ability of the CCD at low levels of illumination is limited mainly by noise in the background charge and the noise of the process of capturing the carriers. Batch addressing matrices include FCCD with a time delay and accumulation (TDA), the use of which can dramatically increase the signal-to-noise ratio and, as a result, realize high sensitivity. One of the main advantages of matrices with TDA is the ability to hybridize them into superlines, the number of elements of which reaches tens of thousands. Modern matrices of TDA are built on the principle of partitioning. Each section of such a matrix makes it possible to carry the charge across the columns in the direction of the register. Since the sections are controlled independently (or partially independently), it is possible to regulate the number of accumulation lines, and consequently the sensitivity of the CCD of the TDA, by sequentially disabling them. Thus, the regulation of the sensitivity of the CCD is carried out and the dynamic range of the CCD and the observation system in general is expanded. To achieve this goal, a mathematical expression was obtained for calculating the number of lines of light sensory elements of a CCD, which should be used when surveying the earth's surface in conditions of low light. In this case, the number of elements along the length of the receiver is determined by the achievement of the required signal / noise ratio, in which the real resolution is determined by the minimum geometric dimensions of the photosensitive element.
Authors and Affiliations
V. P. Manoilov, O. F. Dubyna, I. I. Poleschuk, P. P. Martynchuk
Keywords
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