CALIBRATION OF REFERENCE STANDARD QUARTZ ROTATING PLATES
Journal Title: Metrology and Measurement Systems - Year 2006, Vol 13, Issue 4
Abstract
An accurate linear polarized optical system for calibrating the quartz plate angles is introduced in this work. The quartz plate parallelism and surface roughness are measured using a phase shifting laser interferometer to study their effects on quartz rotation angles which equals to ±18.21 sec. A polynomial regression method is applied to determine and extrapolate quartz rotation angles corresponds to the un-calibrated regions of the visible spectrum. The bi-rotation index values (nL − nR) of the quartz plates for all scanned wavelengths are determined applying the calibrated rotation angles. The uncertainty of the calibrations is evaluated, also the combined uncertainty of calibrations for angles (Δβt≈ ± 0.09°) that shows the usefulness of this article.
Authors and Affiliations
H. SIDKI, M. AMER, F. EL AZIZ
Keywords
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