ESTIMATION OF YOUNG'S MODULUS AND ADHESIVE FORCE OF POLYMERIC FILMS BY USE OF ATOMIC FORCE MICROSCOPE
Journal Title: Metrology and Measurement Systems - Year 2006, Vol 13, Issue 3
Abstract
Nowadays a big interest exists in microengineering forces to study and test microsystems and their components. There exist a lot of methods and tools to perform this kind of investigations. Most of them need good skills, a lot of time and expensive equipment. We would like to present a simple and quick method to determine such material properties as Young's modulus and adhesive (pull-off) force of thin films applied on e.g. working surfaces of microgrippers.
Authors and Affiliations
N. BALABANAVA, Z. RYMUZA, S. CHIZHIK
Keywords
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