Genetics of grain yield and quality characteristics of wheat parents and their F2 progenies as affected by low level of N fertilization

Journal Title: Scientia Agriculturae - Year 2015, Vol 12, Issue 2

Abstract

 Information on the type of gene action controlling the expression of inheritance of wheat grain yield and quality traits under low-N conditions are prerequisite for starting an effective breeding program in Egypt for developing low-N tolerant varieties. For this purpose, diallel crosses (except reciprocals) among six divergent parents in low-N tolerance were made. Parents and F2 crosses were evaluated in two seasons under two N environments; namely 0 kg N/fed (low-N) and 75 kg N/fed (high-N) in two separate experiments using a randomized complete block design with 3 replications. Results of analysis of combining ability across seasons showed that variances due to both general (GCA) and specific (SCA) combining ability were significant for all studied yield and quality traits. The best general combiners with positive effects for improvement of low-N tolerance were L26, L27 and L25 parents. Under low-N, the best F2 cross for SCA effects was L25 x Gem7 for two traits; grain yield/plant (GYPP) and harvest index (HI), L25 x L27 for HI, Gem9 x Gz 168 for spikes/plant (SPP), and GPC and L27 x Gz168 for grain protein content (GPC). The magnitude of dominance (H1) in F2's was much greater than that of additive (D) variance for all studied traits under both high N and low N, suggesting that selection methods that eliminate masking non-additive effects and take advantage of the additive variance should be employed to improve grain yield and quality traits under low-N and high-N environments. The average degree of dominance (H1/D)1/2 in F2's was in the range of partial dominance for all studied traits under the two levels of nitrogen. Narrow-sense heritability (h2n) in F2's was generally higher in magnitude under low-N than high-N for all studied traits and ranged from 16.10% (SPP) to 82.90% (grains/spike; GPS) under high-N and from 25.56% (100 grain weight) to 93.00% (GPS) under low-N.

Authors and Affiliations

A. M. M Al-Naggar, R Shabana, M. M Abd El-Aleem, Zainab A El-Rashidy

Keywords

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  • EP ID EP164221
  • DOI 10.15192/PSCP.SA.2015.12.2.109121
  • Views 109
  • Downloads 0

How To Cite

A. M. M Al-Naggar, R Shabana, M. M Abd El-Aleem, Zainab A El-Rashidy (2015).  Genetics of grain yield and quality characteristics of wheat parents and their F2 progenies as affected by low level of N fertilization. Scientia Agriculturae, 12(2), 109-121. https://europub.co.uk/articles/-A-164221