Study of the Internal Structure of Electronic Components RAM DDR-2 and Motherboard of Nokia-3120 by Using Neutron Radiography Technique
Journal Title: International Journal of Modern Engineering Research (IJMER) - Year 2013, Vol 3, Issue 6
Abstract
Neutron radiography technique has been applied in the present study to detect the internal structure of electronic components RAM DDR-2 and Motherboard of Nokia-3120. In present experiment, electronic RAM model: DDR-2 and motherboard of mobile phone, NOKIA-3120 was collected from shops. Thermal neutron radiography facility of 3MW TRIGA MARK-II research reactor at Atomic Energy Research Establishment, Savar, Dhaka has been adopted for present research. A series of neutron radiographic images were taken to find the optimum exposure time for the samples. The optimum exposure time is evaluated in this experiment is 2 minutes 45 seconds. Some spots have been identified from the radiographic images of the samples.
Authors and Affiliations
Shahajan Miah
Keywords
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