Optical studies of as-deposited and annealed Cu7GeS5I thin films
Journal Title: Semiconductor Physics, Quantum Electronics and Optoelectronics - Year 2016, Vol 19, Issue 2
Abstract
Cu7GeS5I thin films were obtained by non-reactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of as-deposited and annealed Cu7GeS5I thin films were measured in the temperature interval 77–300 K. The temperature behaviour of Urbach absorption edge and dispersion of refractive index for as-deposited and annealed Cu7GeS5I thin films was analyzed. Influence of annealing on the optical parameters and disordering processes in Cu7GeS5I thin films was studied.
Authors and Affiliations
I. P. Studenyak, A. V. Bendak, S. O. Rybak, V. Yu. Izai, P Kúš, M. Mikula
Keywords
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- EP ID EP178128
- DOI 10.15407/spqeo19.02.192
- Views 85
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