PEB Based DWT with an Efficient Fixed Booth Multiplier
Journal Title: International Journal for Research in Applied Science and Engineering Technology (IJRASET) - Year 2016, Vol 4, Issue 8
Abstract
Discrete Wavelet Transform (DWT) derived features used for digital image texture analysis. Wavelets appear to be a suitable tool for this task, because they allow analysis of images at various levels of resolution .The discrete wavelet transform is a linear transformation that operates on a data vector whose length is an integer power of two, transforming it into a numerically different vector of the same length. Since the proposed error compensation bias is realizable, the constructing lowerror fixed width booth multiplier is area time efficient for VLSI implementation. Fixed width multiplier generates an output with the same width as the input. They are widely used in digital signal processing systems. The computation error is introduced if the least significant (LS) half part is directly truncated. To reduce the computation error, many compensation techniques were presented for array multipliers. There is an apparently trade-off between accuracy and hardware complexity. Recently, compensation works have been increasing focused on reducing the truncation error on the booth multiplier. In presented statistical and linear regression analysis to reduce the hardware complexity. However, the truncation error was partly depressed because the estimation information that came from the truncated part is limited. This study proposes a probabilistic estimation bias (PEB) method for reducing the truncation error in a fixed width booth multiplier. The PEB formula is derived from the probabilistic catalysis in the partial product array after the booth encoder. In addition, the low-error and area-efficient PEB circuit is obtained based on the simple and systematic procedure. In this way, the time-consuming exhaustion simulation and the heuristic process of the compensation circuit can be avoided. Furthermore, the hardware efficiency and low error are validated through our simulation results. The main advantage of this method has provided smaller area and smaller truncation errors.
Authors and Affiliations
Surya. P. P, Navin. Y
Keywords
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