Structure and Transport Phenomena in films Pb18Ag2-xSbxTe20 (LAST) on Sital Substrate
Journal Title: Фізика і хімія твердого тіла - Year 2014, Vol 15, Issue 4
Abstract
Influence of the thickness of thin films based compounds Pb18Ag2-xSbxTe20 (x = 0,5; 1,0; 1,5), deposited on sital substrates from their structure and scattering mechanisms are research. Defined that the dominant role playing scattering on the surface due to the increasing size of nanocrystals with increasing of thickness vapor-phase structures.
Authors and Affiliations
D. M. Freik, B. S. Dzundza, S. I. Mudryy, Oksana Kostyuk, V. I. Makovyshyn, R. S. Yavorskyy, Ts. A. Kryskov, T. O. Semko
Keywords
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