AN OVERVIEW OF ELECTRON PROBE MICROANALYSIS

Journal Title: Int J of Preclin & Pharm Res - Year 2014, Vol 4, Issue 2

Abstract

 ABSTRACT Electron Probe Microanalysis (EPMA) is an analytical technique that is used to establish the composition of small areas on specimens. It’s one of the several particle-beam techniques These analytical technique has a high spatial resolution and sensitivity and individual analysis are reasonably short requiring only a minute or two in most cases. The Electron Microprobe can obtain highly magnified secondary and back-scattered electron images of a sample.EPMA is now a vital for condensed matter Physicists working in this field. The characterization is particularly important for thin films and a great deal of work has been devoted to modify them. EPMA correction procedures in order to perform analysis of thin film or layered specimens. At the present time, the instrumentation available for electron probe microanalysis has reached a very high standard of performance and its handling is straightforward as is likely to be achieved. The method offers very great possibilities to analytical chemistry both alone and in combination with other methods indeed, there are few branches of science to which the application of electron probes can bring new and valuable results that could not be achieved by other means. Keywords: Electron Microprobe, Particle-Beam technique, Back-scattered electron.

Authors and Affiliations

Hemasree M*, Shanti Priya D, Raja Shekar S, Ajitha A, Uma Maheshwara Rao V

Keywords

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  • EP ID EP133506
  • DOI -
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How To Cite

Hemasree M*, Shanti Priya D, Raja Shekar S, Ajitha A, Uma Maheshwara Rao V (2014).  AN OVERVIEW OF ELECTRON PROBE MICROANALYSIS. Int J of Preclin & Pharm Res, 4(2), 125-131. https://europub.co.uk/articles/-A-133506