Self-organization in irradiated semiconductor crystals caused by thermal annealing
Journal Title: Semiconductor Physics, Quantum Electronics and Optoelectronics - Year 2018, Vol 21, Issue 2
Abstract
Annealing of complex semiconductors GaP and CdP 2 , irradiated at room temperature by high fluences of electrons within 1…30 MeV energy interval and 80 MeV α -particles, was carried out and main electrical parameters (conductivity σ, carrier concentration n and mobility µ) as well as the positron life-time τ were studied and analyzed. When the point defect concentration excesses some critical value, defects of new kind are formed: oscillation peaks in the isochronous annealing curve appear, and defects with a high cross-section of defect scattering and capture are created. High temperature annealing of the irradiated sample with increased vacancy concentration causes appearance of the vacancy voids with a lower electron density.
Authors and Affiliations
M. ZAVADA
Influence of inter-electron scattering on the form of non-equilibrium distribution function of band carriers
Consideration of different problems of physical kinetics shows that non-equilibrium distribution function of band carriers and, consequently, kinetic coefficients significantly depend on the specific shape of bands and m...
Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy
The main difficulty in obtaining the lateral elemental composition distribution maps of the semiconductor nanostructures by Scanning Auger Microscopy is the thermal drift of the analyzed area, arising from its local heat...
Influence of the presence of a fluxing agent and its composition on the spectral characteristics of ZnS(Cu) obtained by self-propagating high-temperature synthesis
Investigated in this work were the photoluminescence spectra and luminescence excitation spectra of powered ZnS:Cu, obtained using the method of self-propagating high-temperature synthesis (SHS) with addition of NaCl and...
Ellipsometry of hybrid noble metal-dielectric nanostructures
Angular ellipsometric measurements of thin Ag, Cu films covered by HfO 2 protective layer were performed. The ellipsometric parameters ψ and ∆ were measured in θ = 43°...85° light incidence angle range, where ψ is the az...
I127 NQR spectra of Pb1–xCdxI2 and (BiI3)(1–x)(PbI2)x of mixed layered semiconductors
The results of studying the concentration and temperature dependences of NQR spectrum parameters inherent to I127 in mixed layered semiconductors Pbx–1CdxI2 and (BiI3)(1–x)(PbI2)x are presented for x ≤ 0.30 and T = 77…15...