Area and Power Efficient MSIC Test Pattern Generation for BIST Journal title: International Journal for Research in Applied Science and Engineering Technology (IJRASET) Authors: M.Nandini Priya, Dr. (Mrs.) R. Brindha Subject(s): Engineering, Applied Linguistics
Design of Pseudorandom Pattern Generator for MIHST Journal title: International Journal for Research in Applied Science and Engineering Technology (IJRASET) Authors: Nagaveni Patil, Dr. Baswaraj Gadgay, Suman Pujari Subject(s): Engineering, Applied Linguistics
Power Optimization In Digital Circuits Using Scan-Based BIST Journal title: International Journal of Research in Computer and Communication Technology Authors: Ramakrishna Porandla, Gella Ravikanth, Podili Ramu Subject(s): Computer and Information Science, Telecommunications
Design a pattern generator with low switching activity to test complex combinational logic with high test coverage Journal title: International Journal of Research in Computer and Communication Technology Authors: Jay Bharatbhai Dabhi Subject(s): Computer and Information Science, Telecommunications
Detection of Security Hacking Attacks by Scan Based TPG Using Verilog Journal title: Scholars Journal of Engineering and Technology Authors: R. Priyadarsini, S. Anusha Subject(s):
