Structural properties of Zn1-xMnxO films

Journal Title: Indian Journal of Research in Pharmacy and Biotechnology - Year 2016, Vol 4, Issue 6

Abstract

In recent years dilute magnetic semiconductors have paid much attention due to their complementary properties of semiconductors and ferromagnetic behavior. Zn1-xMnxO thin films have been prepared by chemical spray pyrolysis at a deposition temperature of 400 oC with different Mn compositions varied in the range, 0.0 ≤ x ≤0.25, on corning 7059 glass substrates. The as-grown layers were characterized to evaluate the compositional, structural properties. The change of dopants level in ZnO films with composition was analyzed using X-ray photoelectron spectroscope measurements. The X-ray diffraction studies revealed that all the films were strongly oriented along the (002) orientation corresponding to the hexagonal wurtzite structure. The FWHM, lattice parameters, stress and strain increased with Mn-doping.

Authors and Affiliations

L. Raja Mohan Reddy

Keywords

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  • EP ID EP33411
  • DOI -
  • Views 287
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How To Cite

L. Raja Mohan Reddy (2016). Structural properties of Zn1-xMnxO films. Indian Journal of Research in Pharmacy and Biotechnology, 4(6), -. https://europub.co.uk/articles/-A-33411