Be-ion implanted p-n InSb diode for infrared applications. Modeling, fabrication and characterization

Abstract

Transport theory for modeling the electric characteristics of high-quality p-n diodes has been developed. This theory takes into account a non-uniform profile of p- doping, finite thickness of the quasi-neutral regions and possible non-uniformity of the bulk recombination coefficient. The theory is based on related solutions of the Poisson equation, drift-diffusion equation and continuity equation with a generation-recombination term taking into account the simple band-to-band generation/recombination model. We have ascertained that the non-uniform profile of p-doping can lead to formation of p-n junctions with a specific two-slope form of the electrostatic barrier and two regions with the high built-in electric fields. We have found that at strong p + -doping the band structure of the InSb p-n junction has the form that can facilitate the emergence of additional mechanisms of current flow due to the tunneling and avalanche effects at the reverse bias. Using the literary data of the electron and hole lifetimes in InSb at cryogenic temperatures, we have found that the coefficient of bulk recombination can have an essential spatial dependence and considerably increases in the space charge region of p-n diode. The theory was applied to our analysis of p-n InSb diodes with p + -doping by using Be-ion implantation performed in ISP NASU. The theory predicts optimal conditions for detection of infrared emission. The technological process of fabrication, processing and testing has been described in details. Theoretically, it has been found that for parameters of the fabricated diodes and at 77 K the dark currents limited by diffusion and generation-recombination mechanisms should be less than 0.1 μA at the inverse bias of the order of 0.1 V. The measured diode’s I-V characteristics were expected to have strong asymmetry, however, dark currents are by one order larger than those predicted by theory. The latter can be associated with a

Authors and Affiliations

V. V. Korotyeyev

Keywords

Related Articles

Self-organization in irradiated semiconductor crystals caused by thermal annealing

Annealing of complex semiconductors GaP and CdP 2 , irradiated at room temperature by high fluences of electrons within 1…30 MeV energy interval and 80 MeV α -particles, was carried out and main electrical parameters (co...

Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface

The influence of porous alumina template morphology on silicon films growth at deposition by PE CVD has been investigated. As it was shown, the structural properties of silicon phases depend on the pore geometry and surf...

Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy

The main difficulty in obtaining the lateral elemental composition distribution maps of the semiconductor nanostructures by Scanning Auger Microscopy is the thermal drift of the analyzed area, arising from its local heat...

Features of tensoresistance in single crystals of germanium and silicon with different dopants

Tensoresistance in single crystals of germanium and silicon with different dopants but under practically equal charge carrier concentrations have been investigated. The features of X /0 = f (X) function, which depend o...

Quantum-size effects in semiconductor heterosystems

Created on the basis of Si, GaAs and C60 fullerenes were low-dimensional heterostructures with a surface quantum-size effect at the film-substrate interface. There have been defined technological conditions of its appear...

Download PDF file
  • EP ID EP416062
  • DOI 10.15407/spqeo21.03.294
  • Views 78
  • Downloads 0

How To Cite

V. V. Korotyeyev (2018). Be-ion implanted p-n InSb diode for infrared applications. Modeling, fabrication and characterization. Semiconductor Physics, Quantum Electronics and Optoelectronics, 21(3), 294-306. https://europub.co.uk/articles/-A-416062