Test Point Selection and Multiple Soft Faults Detection in Linear Analog Circuits Based on Multiple Frequency Measurements

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Test Point Selection and Multiple Soft Faults Detection in Linear Analog Circuits Based on Multiple Frequency Measurements

Journal Title: PARIPEX-Indian Journal of Research - Year 2015, Vol 4, Issue 7

Abstract

A method to identify and select test points for analog circuit testing and to detect multiple soft faults in linear analog circuits using multiple frequency measurements is proposed in this paper. Modified nodal analysis (MNA) method is used to simulate the circuit under test (CUT) and to derive the circuit parameters. With the knowledge of circuit topology and the component values, the test vectors associated with each components of the CUT are derived. The group of potentially faulty components, suitable test nodes and diagnosis variables for testing are identified and selected based on the test vectors. To solve the component tolerance issue in analog circuit testing, fault detection is performed based on the diagnosis variables obtained from multiple frequency measurements for fault free and faulty conditions of the CUT. Effectiveness of the proposed method is validated through the results obtained from simulation of benchmark circuits.

Authors and Affiliations

G. Puvaneswari, S. UmaMaheswari

Keywords

analog circuit – fault diagnosis – test vector –tolerance –test node – multifrequency- modified nodal analysis

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EP ID EP572825
DOI -
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